This full day workshop aims to provide Manufacturer with adequate information on the fundamentals

of UL’s Follow-Up Services (FUS) Program focused on the customer’s specific needs, production

methods and practices.

Explain FUS procedures and practices, passing on essential knowledge that will help

the manufacturer prepare for their FUS inspections.

Manufacturer can better plan their production by knowing UL’s policies and the

requirements of the FUS program. Knowing the required traceability requirements

and incorporating these in the factory’s quality process will speed up the inspection

process, instilling confidence in the factory’s ability to produce compliant products.

Minimize/eliminate potential problems that could cause delays in the use of UL Marks

on a manufacturer’s product(s).

To effectively maintain the high integrity of the UL Mark, UL will implement the

Increased Monitoring Program (IMP) at those manufacturers that fail to ensure

compliance with UL requirements. FUSTART increases

a manufacturer’s

understanding of the FUS requirements thus reducing the likelihood of UL needing to

The Symposium is aimed to provide a platform for integrated circuit and technology communities to meet and present the latest developments in all the areas of integrated circuit design, technology and system integration, with emphasis on wireless communication systems. It is an excellent opportunity for industry and academia to network and interact with each other. RFIT2009 will be held in Singapore, one of the most vibrant countries in Asia.

RFIT2009 will be again featured with a mixture of invited and contributed papers. Distinguished researchers will be invited to deliver keynote speeches and invited papers on the technology trends and significant advancements in the field. Best papers will be awarded.

Regular papers accepted by RFIT2009 will appear in IEEE Xplorer and The Engineering Index (EI) and extended version can be published in a Special issue of IEEE Transactions on Microwave Theory and Techniques (subject to the normal manuscript review).